Meliorum Technologies, Inc. adds value
to its products by providing nanomaterial
characterization services for your convenience.
Equipment available includes:
Dynamic
light scattering / photon correlation
spectroscopy particle size characterization
system to produce particle size mean and
range. Working size range: 1 nm to 30
micron
Transmission
electron microscope (TEM) for direct sample
analysis or diffraction pattern determination.
Resolution: 1 nm
Atomic
force microscope (AFM) for determination
of surface topology. Resolution: 10 nm
